Programming non-volatile memory with high resolution variable initial programming pulse

ABSTRACT

Multiple programming processes are performed for a plurality of non-volatile storage elements. Each of the programming processes operate to program at least a subset of the non-volatile storage elements to a respective set of target conditions using program pulses. At least a subset of the programming processes include identifying a program pulse associated with achieving a particular result for a respective programming process and performing one or more sensing operations at one or more alternative results for the non-volatile storage elements. Subsequent programming process are adjusted based on a first alternative result and the identification of the program pulse if the one or more sensing operations determined that greater than a predetermined number of non-volatile storage elements achieved the first alternative result. Subsequent programming process are adjusted based on the identification of the program pulse if the one or more sensing operations determined that less than a required number of non-volatile storage elements achieved any of the alternative results.

This application claims the benefit of U.S. Provisional Application No.61/108,124, “Programming Non-Volatile Memory With Variable InitialProgramming Pulse,” by Gerrit Jan Hemink, filed on Oct. 24, 2008,incorporated herein by reference.

BACKGROUND OF THE INVENTION

1. Field

The present invention relates to non-volatile storage.

2. Description of the Related Art

Semiconductor memory devices have become more popular for use in variouselectronic devices. For example, non-volatile semiconductor memory isused in cellular telephones, digital cameras, personal digitalassistants, mobile computing devices, non-mobile computing devices andother devices. Electrical Erasable Programmable Read Only Memory(EEPROM) and flash memory are among the most popular non-volatilesemiconductor memories.

Both EEPROM and flash memory utilize a floating gate that is positionedabove and insulated from a channel region in a semiconductor substrate.The floating gate is positioned between source and drain regions. Acontrol gate is provided over and insulated from the floating gate. Thethreshold voltage of the transistor is controlled by the amount ofcharge that is retained on the floating gate. That is, the minimumamount of voltage that must be applied to the control gate before thetransistor is turned on to permit conduction between its source anddrain is controlled by the level of charge on the floating gate.

When programming an EEPROM or flash memory device, typically a programvoltage is applied to the control gate and the bit line is grounded.Electrons from the channel are injected into the floating gate. Whenelectrons accumulate in the floating gate, the floating gate becomesnegatively charged and the threshold voltage of the memory cell israised so that the memory cell is in the programmed state. Moreinformation about programming can be found in U.S. Pat. No. 6,859,397,titled “Source Side Self Boosting Technique For Non-Volatile Memory;”and in U.S. Pat. No. 6,917,542, titled “Detecting Over ProgrammedMemory,” both patents are incorporated herein by reference in theirentirety.

Some EEPROM and flash memory devices have a floating gate that is usedto store two ranges of charges and, therefore, the memory cell can beprogrammed/erased between two states, an erased state and a programmedstate that correspond to data “1” and data “0.” Such a device isreferred to as a binary device.

A multi-state flash memory cell is implemented by identifying multiple,distinct allowed threshold voltage ranges. Each distinct thresholdvoltage range corresponds to a predetermined value for the set of databits. The specific relationship between the data programmed into thememory cell and the threshold voltage ranges of the cell depends uponthe data encoding scheme adopted for the memory cells. For example, U.S.Pat. No. 6,222,762 and U.S. Patent Application Publication No.2004/0255090, both of which are incorporated herein by reference intheir entirety, describe various data encoding schemes for multi-stateflash memory cells.

In some embodiments, the program voltage applied to the control gateincludes a series of pulses that are increased in magnitude with eachsuccessive pulse by a predetermined step size (e.g. 0.2 v, 0.3 v, 0.4 v,or others). The choice of the magnitude of program voltage is acompromise. Too high of a magnitude will result in some memory cellsbeing over-programmed, while too low of a magnitude will result inlonger programming times. Typically, users of non-volatile memory desirethat the memory program quickly.

In the prior art devices, the same program signal is used for newdevices that have not been significantly used (also called freshdevices) and heavily used devices. However, as a non-volatile memorydevice undergoes many programming cycles, charge becomes trapped in theinsulation between the floating gate and the channel region. Thistrapping of charge shifts the threshold voltage to a higher level, whichallows the memory cell to program quicker. If the magnitude of theprogram voltage is set too high, even though it does not result in overprogramming of a fresh device, as that device becomes more heavily usedthen that device may experience over programming. Thus, new devices willhave their program voltage set low enough to avoid over programming whenthe device is older. This lowering of the magnitude of the programvoltage will reduce the speed at which the fresh device programs data.

SUMMARY OF THE INVENTION

The technology described herein attempts to increase the speed ofprogramming while reducing the risk of over-programming.

One embodiment includes performing one stage of a multi-stageprogramming process on a plurality of non-volatile storage elements. Themulti-stage programming process programs the plurality of non-volatilestorage elements to one or more final target conditions. The one stageincludes programming the non-volatile storage elements to one or morefirst interim target conditions using a first set of program pulses.Performing the one stage includes identifying a program pulse associatedwith achieving a particular result, performing one or more sensingoperations for one or more alternative results for the non-volatilestorage elements, storing an indication based on a first alternateresult of the one or more alternative results and the identified programpulse if the sensing operation determines that greater than apredetermined number of the non-volatile storage elements achieved thefirst alternative result, and storing the indication based on theidentified program pulse if the sensing operation does not determinethat sufficient number of non-volatile storage elements achieved the oneor more alternative results. The method further includes performing anadditional stage of the multi-stage programming process, includingapplying a second set of program pulses having an initial pulse with amagnitude set based on the stored indication.

One embodiment includes performing multiple programming processes for aplurality of non-volatile storage elements. Each of the programmingprocesses operate to program at least a subset of the non-volatilestorage elements to a respective set of target conditions using programpulses. For at least a subset of the programming processes, the methodincludes identifying a program pulse associated with achieving aparticular result for a respective programming process, performing oneor more sensing operations at one or more alternative results for thenon-volatile storage elements, using a first alternative result of theone or more alternative results and the identification of the programpulse to adjust programming for a subsequent programming process for thenon-volatile storage elements if the one or more sensing operationsdetermined that greater than a predetermined number of non-volatilestorage elements achieved the first alternative result, and using theidentification of the program pulse to adjust programming for thesubsequent programming process for the non-volatile storage elements ifthe one or more sensing operations determined that less than a requirednumber of non-volatile storage elements achieved any of the alternativeresults.

One embodiment includes performing a first stage of a multi-stageprogramming process on a plurality of non-volatile storage elements. Themulti-stage programming process programs the plurality of non-volatilestorage elements to one or more final target conditions. The first stageprograms at least a subset of the non-volatile storage elements to oneor more first interim target conditions. The performing of the firststage includes applying a first set of programming pulses to thenon-volatile storage elements with a first increment between programmingpulses, determining that at least a predetermined number of the subsetof non-volatile storage elements have reached an intermediate conditionfor the first stage in response to a nth programming pulse of the firstset of programming pulses (the intermediate condition for the firststage is different than the one or more first stage target conditions),performing a sensing operation at an alternative condition for thesubset of non-volatile storage elements in response to determining thatat least the predetermined number of the subset of non-volatile storageelements have reached an intermediate condition, storing an indicationbased on the alternative condition if the sensing operation foundgreater than a predefined number of non-volatile storage elements in thealternative condition, storing an indication based on the intermediatecondition if the sensing operation did not find greater than thepredefined number of non-volatile storage elements in the alternativecondition, changing the first set of programming pulses to have a secondincrement between programming pulses in response to determining that atleast the predetermined number of the subset of non-volatile storageelements have reached the intermediate condition for the first stage(the second increment between programming pulses is smaller than thefirst increment between programming pulses), and terminating the firststage when a sufficient number of the non-volatile storage elements havereached the respective one or more first stage target conditions. Themethod further includes performing an additional stage of themulti-stage programming process including applying a second set ofprogramming pulses to the plurality of non-volatile storage elements.The second set of programming pulses have an initial pulse with amagnitude set based on the stored indication.

One embodiment includes a plurality of non-volatile storage elements andone or more managing circuits in communication with the plurality ofnon-volatile storage elements. The one or more managing circuits performmultiple programming processes for the plurality of non-volatile storageelements. Each of the programming processes operates to program at leasta subset of the non-volatile storage elements to a respective set oftarget conditions using program pulses. For at least a subset of theprogramming processes the one or more managing circuits identify aprogram pulse associated with achieving a particular result for arespective programming process and perform one or more sensingoperations at one or more alternative results for the non-volatilestorage elements. The one or more managing circuits use a firstalternative result of the one or more alternative results and theidentification of the program pulse to adjust programming for asubsequent programming process for the non-volatile storage elements ifthe one or more sensing operations determined that greater than apredetermined number of non-volatile storage elements achieved the firstalternative result. The one or more managing circuits use theidentification of the program pulse to adjust programming for thesubsequent programming process for the non-volatile storage elements ifthe one or more sensing operations determined that less than a requirednumber of non-volatile storage elements achieved any of the alternativeresults.

One embodiment includes a plurality of non-volatile storage elements andone or more managing circuits in communication with the plurality ofnon-volatile storage elements. The one or more managing circuits performone stage of a multi-stage programming process on the plurality ofnon-volatile storage elements. The multi-stage programming processprograms the plurality of non-volatile storage elements to one or morefinal target conditions. The one stage includes the one or more managingcircuits programming the non-volatile storage elements to one or morefirst interim target conditions using a first set of programming pulsesand identifying a program pulse associated with achieving a particularresult. The one or more managing circuits perform one or more sensingoperations for one or more alternative results for the non-volatilestorage elements during the one stage. The one or more managing circuitsstore an indication based on a first alternate result and the identifiedprogram pulse if the sensing operation determined that greater than apredetermined number of the non-volatile storage elements achieved thefirst alternative result. The one or more managing circuits store theindication based on the identified program pulse if the sensingoperation does not determine that sufficient number of non-volatilestorage elements achieved the one or more alternative results. The oneor more managing circuits perform an additional stage of the multi-stageprogramming process including applying a second set of programmingpulses having an initial pulse with a magnitude set based on the storedindication.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a top view of a NAND string.

FIG. 2 is an equivalent circuit diagram of the NAND string.

FIG. 3 is a block diagram of a non-volatile memory system.

FIG. 4 is a block diagram depicting one embodiment of a memory array.

FIG. 5 is a block diagram depicting one embodiment of a sense block.

FIG. 6 depicts an example set of threshold voltage distributions anddepicts an example programming process.

FIG. 7 depicts an example set of threshold voltage distributions anddepicts an example programming process.

FIGS. 8A-8C depict examples of threshold voltage distributions and anexample programming process.

FIGS. 9A-9C depict examples of threshold voltage distributions and anexample programming process.

FIGS. 10A-10D depict examples of threshold voltage distributions and anexample programming process.

FIGS. 11A and 11B depict examples of threshold voltage distributions andan example programming process.

FIGS. 12A-12D depict examples of threshold voltage distributions and anexample programming process.

FIGS. 13A-13D depict examples of threshold voltage distributions and anexample programming process.

FIG. 14 is a flow chart describing one embodiment of a process foroperating non-volatile storage.

FIG. 15 is a flow chart describing one embodiment of a process forprogramming non-volatile storage.

FIG. 16 is a flow chart describing one embodiment of a process forprogramming non-volatile storage.

FIG. 17 depicts an example set of programming pulses.

FIG. 18 depicts an example set of programming pulses.

FIGS. 19-26 are flow charts describing various embodiments forperforming programming processes.

FIGS. 27A-C and 28A-C are graphs that explain a coarse/fine programmingscheme.

FIG. 29 is a flow chart describing one embodiment of a process forprogramming non-volatile storage.

FIGS. 30-32 are graphs depicting threshold voltage distributions.

FIG. 33 is a flow chart describing one embodiment of a process forsensing information about a group of non-volatile storage elements.

FIG. 34 is a flow chart describing one embodiment of a process forsensing information about a group of non-volatile storage elements.

DETAILED DESCRIPTION

One example of a flash memory system uses the NAND structure, whichincludes arranging multiple transistors in series, sandwiched betweentwo select gates. The transistors in series and the select gates arereferred to as a NAND string. FIG. 1 is a top view showing one NANDstring. FIG. 2 is an equivalent circuit thereof. The NAND stringdepicted in FIGS. 1 and 2 includes four transistors 100, 102, 104 and106 in series and sandwiched between a first (drain side) select gate120 and a second (source side) select gate 122. Select gate 120 connectsthe NAND string to a bit line via bit line contact 126. Select gate 122connects the NAND string to source line 128. Select gate 120 iscontrolled by applying the appropriate voltages to select line SGD.Select gate 122 is controlled by applying the appropriate voltages toselect line SGS. Each of the transistors 100, 102, 104 and 106 has acontrol gate and a floating gate. For example, transistor 100 hascontrol gate 100CG and floating gate 100FG. Transistor 102 includescontrol gate 102CG and a floating gate 102FG. Transistor 104 includescontrol gate 104CG and floating gate 104FG. Transistor 106 includes acontrol gate 106CG and a floating gate 106FG. Control gate 100CG isconnected to word line WL3, control gate 102CG is connected to word lineWL2, control gate 104CG is connected to word line WL1, and control gate106CG is connected to word line WL0.

Note that although FIGS. 1 and 2 show four memory cells in the NANDstring, the use of four memory cells is only provided as an example. ANAND string can have less than four memory cells or more than fourmemory cells. For example, some NAND strings will include eight memorycells, 16 memory cells, 32 memory cells, 64 memory cells, 128 memorycells, etc. The discussion herein is not limited to any particularnumber of memory cells in a NAND string. One embodiment uses NANDstrings with 66 memory cells, where 64 memory cells are used to storedata and two of the memory cells are referred to as dummy memory cellsbecause they do not store data.

A typical architecture for a flash memory system using a NAND structurewill include several NAND strings. Each NAND string is connected to thecommon source line by its source select gate controlled by select lineSGS and connected to its associated bit line by its drain select gatecontrolled by select line SGD. Each bit line and the respective NANDstring(s) that are connected to that bit line via a bit line contactcomprise the columns of the array of memory cells. Bit lines are sharedwith multiple NAND strings. Typically, the bit line runs on top of theNAND strings in a direction perpendicular to the word lines and isconnected to a sense amplifier.

Relevant examples of NAND type flash memories and their operation areprovided in the following U.S. patents/patent applications, all of whichare incorporated herein by reference: U.S. Pat. No. 5,570,315; U.S. Pat.No. 5,774,397; U.S. Pat. No. 6,046,935; U.S. Pat. No. 6,456,528; andU.S. Pat. Publication No. US2003/0002348.

Other types of non-volatile storage devices, in addition to NAND flashmemory, can also be used. For example, non-volatile memory devices arealso manufactured from memory cells that use a dielectric layer forstoring charge. Instead of the conductive floating gate elementsdescribed earlier, a dielectric layer is used. Such memory devicesutilizing dielectric storage element have been described by Eitan etal., “NROM: A Novel Localized Trapping, 2-Bit Nonvolatile Memory Cell,”IEEE Electron Device Letters, vol. 21, no. 11, November 2000, pp.543-545. An ONO dielectric layer extends across the channel betweensource and drain diffusions. The charge for one data bit is localized inthe dielectric layer adjacent to the drain, and the charge for the otherdata bit is localized in the dielectric layer adjacent to the source.U.S. Pat. Nos. 5,768,192 and 6,011,725 disclose a non-volatile memorycell having a trapping dielectric sandwiched between two silicon dioxidelayers. Multi-state data storage is implemented by separately readingthe binary states of the spatially separated charge storage regionswithin the dielectric. Non-volatile storage based on MONOS or TANOStypes of structures or nanocrystals can also be used. Other types ofnon-volatile storage can also be used.

FIG. 3 illustrates a memory device 210 having read/write circuits forreading and programming a page (or other unit) of memory cells (e.g.,NAND multi-state flash memory) in parallel. Memory device 210 mayinclude one or more memory die or chips 212. Memory die 212 includes anarray (two-dimensional or three dimensional) of memory cells 200,control circuitry 220, and read/write circuits 230A and 230B. In oneembodiment, access to the memory array 200 by the various peripheralcircuits is implemented in a symmetric fashion, on opposite sides of thearray, so that the densities of access lines and circuitry on each sideare reduced by half. The read/write circuits 230A and 230B includemultiple sense blocks 300 which allow a page of memory cells to be reador programmed in parallel. The memory array 200 is addressable by wordlines via row decoders 240A and 240B and by bit lines via columndecoders 242A and 242B. Word lines and bit lines are examples of controllines. In a typical embodiment, a controller 244 is included in the samememory device 210 (e.g., a removable storage card or package) as the oneor more memory die 212. Commands and data are transferred between thehost and controller 244 via lines 232 and between the controller and theone or more memory die 212 via lines 234.

Control circuitry 220 cooperates with the read/write circuits 230A and230B to perform memory operations on the memory array 200. The controlcircuitry 220 includes a state machine 222, an on-chip address decoder224, and a power control module 226. The state machine 222 provideschip-level control of memory operations. The on-chip address decoder 224provides an address interface between that used by the host or a memorycontroller to the hardware address used by the decoders 240A, 240B,242A, and 242B. The power control module 226 controls the power andvoltages supplied to the word lines and bit lines during memoryoperations. In one embodiment, power control module 226 includes one ormore charge pumps that can create voltages larger than the supplyvoltage. Control circuitry 220 provides address lines ADDR to rowdecoders 240A and 204B, as well as column decoders 242A and 242B. Columndecoders 242A and 242B provide data to controller 244 via the signallines marked Data I/O.

In one embodiment, one or any combination of control circuitry 220,power control circuit 226, decoder circuit 224, state machine circuit222, decoder circuit 242A, decoder circuit 242B, decoder circuit 240A,decoder circuit 240B, read/write circuits 230A, read/write circuits230B, and/or controller 244 can be referred to as one or more managingcircuits. The one or more managing circuits perform the processesdescribed herein.

FIG. 4 depicts an exemplary structure of memory cell array 200. In oneembodiment, the array of memory cells is divided into a large number ofblocks (e.g., blocks 0-1023, or another amount of blocks) of memorycells. As is common for flash memory systems, the block is the unit oferase. That is, each block contains the minimum number of memory cellsthat are erased together. Other units of erase can also be used.

A block contains a set of NAND stings which are accessed via bit lines(e.g., bit lines BL0-BL69,623) and word lines (WL0, WL1, WL2, WL3). FIG.4 shows four memory cells connected in series to form a NAND string.Although four cells are shown to be included in each NAND string, moreor less than four can be used (e.g., 16, 32, 64, 128 or another numberor memory cells can be on a NAND string). One terminal of the NANDstring is connected to a corresponding bit line via a drain select gate(connected to select gate drain line SGD), and another terminal isconnected to the source line via a source select gate (connected toselect gate source line SGS).

Each block is typically divided into a number of pages. In oneembodiment, a page is a unit of programming. Other units of programmingcan also be used. One or more pages of data are typically stored in onerow of memory cells. For example, one or more pages of data may bestored in memory cells connected to a common word line. A page can storeone or more sectors. A sector includes user data and overhead data (alsocalled system data). Overhead data typically includes header informationand Error Correction Codes (ECC) that have been calculated from the userdata of the sector. The controller (or other component) calculates theECC when data is being programmed into the array, and also checks itwhen data is being read from the array. Alternatively, the ECCs and/orother overhead data are stored in different pages, or even differentblocks, than the user data to which they pertain. A sector of user datais typically 512 bytes, corresponding to the size of a sector inmagnetic disk drives. A large number of pages form a block, anywherefrom 8 pages, for example, up to 32, 64, 128 or more pages. Differentsized blocks, pages and sectors can also be used. Additionally, a blockcan have more or less than 69,624 bit lines.

FIG. 5 is a block diagram of an individual sense block 300 partitionedinto a core portion, referred to as a sense module 480, and a commonportion 490. In one embodiment, there will be a separate sense module480 for each bit line and one common portion 490 for a set of multiplesense modules 480. In one example, a sense block will include one commonportion 490 and eight sense modules 480. Each of the sense modules in agroup will communicate with the associated common portion via a data bus472. One example can be found in U.S. Patent Application Publication2006/0140007, which is incorporated herein by reference in its entirety.

Sense module 480 comprises sense circuitry 470 that determines whether aconduction current in a connected bit line is above or below apredetermined level. In some embodiments, sense module 480 includes acircuit commonly referred to as a sense amplifier. Sense module 480 alsoincludes a bit line latch 482 that is used to set a voltage condition onthe connected bit line. For example, a predetermined state latched inbit line latch 482 will result in the connected bit line being pulled toa state designating program inhibit (e.g., Vdd) in order to lock outmemory cells from programming.

Common portion 490 comprises a processor 492, a set of data latches 494and an I/O Interface 496 coupled between the set of data latches 494 anddata bus 420. Processor 492 performs computations. For example, one ofits functions is to determine the data stored in the sensed memory celland store the determined data in the set of data latches. The set ofdata latches 494 is used to store data bits determined by processor 492during a read operation. It is also used to store data bits importedfrom the data bus 420 during a program operation. The imported data bitsrepresent write data meant to be programmed into the memory. I/Ointerface 496 provides an interface between data latches 494 and thedata bus 420.

During read or sensing, the operation of the system is under the controlof state machine 222 that controls (using power control 226) the supplyof different control gate voltages to the addressed memory cell(s). Asit steps through the various predefined control gate voltagescorresponding to the various memory states supported by the memory, thesense module 480 may trip at one of these voltages and an output will beprovided from sense module 480 to processor 492 via bus 472. At thatpoint, processor 492 determines the resultant memory state byconsideration of the tripping event(s) of the sense module and theinformation about the applied control gate voltage from the statemachine via input lines 493. It then computes a binary encoding for thememory state and stores the resultant data bits into data latches 494.In another embodiment of the core portion, bit line latch 482 servesdouble duty, both as a latch for latching the output of the sense module480 and also as a bit line latch as described above.

It is anticipated that some implementations will include multipleprocessors 492. In one embodiment, each processor 492 will include anoutput line (not depicted in FIG. 5) such that each of the output linesis wired-OR'd together. In some embodiments, the output lines areinverted prior to being connected to the wired-OR line. Thisconfiguration enables a quick determination during the programverification process of when the programming process has completedbecause the state machine receiving the wired-OR line can determine whenall bits being programmed have reached the desired level. For example,when each bit has reached its desired level, a logic zero for that bitwill be sent to the wired-OR line (or a data one is inverted). When allbits output a data 0 (or a data one inverted), then the state machineknows to terminate the programming process. In embodiments where eachprocessor communicates with eight sense modules, the state machine may(in some embodiments) need to read the wired-OR line eight times, orlogic is added to processor 492 to accumulate the results of theassociated bit lines such that the state machine need only read thewired-OR line one time.

Data latch stack 494 contains a stack of data latches corresponding tothe sense module. In one embodiment, there are three (or four or anothernumber) data latches per sense module 480. In one embodiment, thelatches are each one bit.

During program or verify, the data to be programmed is stored in the setof data latches 494 from the data bus 420. During the verify process,Processor 492 monitors the verified memory state relative to the desiredmemory state. When the two are in agreement, processor 492 sets the bitline latch 482 so as to cause the bit line to be pulled to a statedesignating program inhibit. This inhibits the memory cell coupled tothe bit line from further programming even if it is subjected toprogramming pulses on its control gate. In other embodiments theprocessor initially loads the bit line latch 482 and the sense circuitrysets it to an inhibit value during the verify process.

In some implementations (but not required), the data latches areimplemented as a shift register so that the parallel data stored thereinis converted to serial data for data bus 420, and vice versa. In onepreferred embodiment, all the data latches corresponding to theread/write block of memory cells can be linked together to form a blockshift register so that a block of data can be input or output by serialtransfer. In particular, the bank of read/write modules is adapted sothat each of its set of data latches will shift data in to or out of thedata bus in sequence as if they are part of a shift register for theentire read/write block.

Additional information about the sensing operations and sense amplifierscan be found in (1) United States Patent Application Pub. No.2004/0057287, “Non-Volatile Memory And Method With Reduced Source LineBias Errors,” published on Mar. 25, 2004; (2) United States PatentApplication Pub No. 2004/0109357, “Non-Volatile Memory And Method withImproved Sensing,” published on Jun. 10, 2004; (3) U.S. PatentApplication Pub. No. 20050169082; (4) U.S. Patent Publication2006/0221692, titled “Compensating for Coupling During Read Operationsof Non-Volatile Memory,” Inventor Jian Chen, filed on Apr. 5, 2005; and(5) U.S. Patent Application Publication No. 2006/0158947, titled“Reference Sense Amplifier For Non-Volatile Memory,” Inventors Siu LungChan and Raul-Adrian Cernea, filed on Dec. 28, 2005. All five of theimmediately above-listed patent documents are incorporated herein byreference in their entirety.

At the end of a successful programming process (with verification), thethreshold voltages of the memory cells should be within one or moredistributions of threshold voltages for programmed memory cells orwithin a distribution of threshold voltages for erased memory cells, asappropriate. FIG. 6 illustrates example threshold voltage distributions(corresponding to data states) for the memory cell array when eachmemory cell stores two bits of data. Other embodiments, however, may usemore or less than two bits of data per memory cell (e.g., such as three,or four or more bits of data per memory cell).

FIG. 6 shows a first threshold voltage distribution E for erased memorycells. Three threshold voltage distributions, A, B and C for programmedmemory cells are also depicted. In one embodiment, the thresholdvoltages in the E distribution are negative and the threshold voltagesin the A, B and C distributions are positive. Each distinct thresholdvoltage distribution of FIG. 6 corresponds to predetermined values forthe set of data bits. The specific relationship between the dataprogrammed into the memory cell and the threshold voltage levels of thecell depends upon the data encoding scheme adopted for the cells. Forexample, U.S. Pat. No. 6,222,762 and U.S. Patent Application PublicationNo. 2004/0255090, both of which are incorporated herein by reference intheir entirety, describe various data encoding schemes for multi-stateflash memory cells. In one embodiment, data values are assigned to thethreshold voltage ranges using a Gray code assignment so that if thethreshold voltage of a floating gate erroneously shifts to itsneighboring physical state, only one bit will be affected. One exampleassigns “11” to threshold voltage range E (state E), “10” to thresholdvoltage range A (state A), “00” to threshold voltage range B (state B)and “01” to threshold voltage range C (state C). However, in otherembodiments, Gray code is not used. Although FIG. 6 shows four states,the present invention can also be used with other multi-state structuresincluding those that include more or less than four states.

FIG. 6 also shows three read reference voltages, Vra, Vrb and Vrc, forreading data from memory cells. By testing whether the threshold voltageof a given memory cell is above or below Vra, Vrb and Vrc, the systemcan determine what state the memory cell is in. FIG. 6 also shows threeverify reference voltages, Vva, Vvb and Vvc. When programming memorycells to state A, the system will test whether those memory cells have athreshold voltage greater than or equal to Vva. When programming memorycells to state B, the system will test whether the memory cells havethreshold voltages greater than or equal to Vvb. When programming memorycells to state C, the system will determine whether memory cells havetheir threshold voltage greater than or equal to Vvc.

In one embodiment, known as full sequence programming, memory cells canbe programmed from the erase state E directly to any of the programmedstates A, B or C. For example, a population of memory cells to beprogrammed may first be erased so that all memory cells in thepopulation are in erased state E. Then, a programming process is used toprogram memory cells directly into states A, B or C. While some memorycells are being programmed from state E to state A, other memory cellsare being programmed from state E to state B and/or from state E tostate C.

FIG. 7 illustrates one example of a two-stage technique of programming amulti-state memory cell that stores data for two different pages: alower page and an upper page. Four states are depicted: state E (11),state A (10), state B (00) and state C (01). For state E, both pagesstore a “1.” For state A, the lower page stores a “0” and the upper pagestores a “1.” For state B, both pages store “0.” For state C, the lowerpage stores “1” and the upper page stores “0.” Note that althoughspecific bit patterns have been assigned to each of the states,different bit patterns may also be assigned. In a first programmingstage, the memory cells' threshold voltages levels are set according tothe bit to be programmed into the lower logical page. If that bit is alogic “1,” the threshold voltage is not changed since the respectivememory cell is in the appropriate state as a result of having beenearlier erased. However, if the bit to be programmed is a logic “0,” thethreshold level of the cell is increased to be state A, as shown byarrow 504. That concludes the first programming stage.

In a second programming stage, the memory cell's threshold voltage levelis set according to the bit being programmed into the upper logicalpage. If the upper logical page bit is to store a logic “1,” then noprogramming occurs since the memory cell is in one of states E or A,depending upon the programming of the lower page bit, both of whichcarry an upper page bit of “1.” If the upper page bit is to be a logic“0,” then the threshold voltage is shifted. If the first stage resultedin the memory cell remaining in the erased state E, then in the secondstage the memory cell is programmed so that the threshold voltage isincreased to be within state C, as depicted by arrow 502. If the memorycell had been programmed into state A as a result of the firstprogramming stage, then the memory cell is further programmed in thesecond stage so that the threshold voltage is increased to be withinstate B, as depicted by arrow 506. The result of the second stage is toprogram the memory cell into the state designated to store a logic “0”for the upper page without changing the data for the lower page.

In one embodiment, a system can be set up to perform full sequencewriting if enough data is written to fill up an entire page. If notenough data is written for a full page, then the programming process canprogram the lower page programming with the data received. Whensubsequent data is received, the system will then program the upperpage. In yet another embodiment, the system can start writing in themode that programs the lower page and convert to full sequenceprogramming mode if enough data is subsequently received to fill up anentire (or most of a) word line's memory cells. More details of such anembodiment are disclosed in U.S. Patent Application 2006/0126390,incorporated herein by reference in its entirety.

FIGS. 8A-C describe another multi-stage programming process forprogramming non-volatile memory. The process of FIG. 8A-C reducesfloating gate to floating gate coupling by, for any particular memorycell, writing to that particular memory cell with respect to aparticular page subsequent to writing to adjacent memory cells forprevious pages. In one example of an implementation of the processtaught by FIGS. 8A-C, the non-volatile memory cells store two bits ofdata per memory cell, using four data states. For example, assume thatstate E is the erased state and states A, B and C are the programmedstates. State E stores data 11. State A stores data 01. State B storesdata 10. State C stores data 00. This is an example of non-Gray codingbecause both bits change between adjacent states A & B. Other encodingsof data to physical data states can also be used. Each memory cellstores two pages of data. For reference purposes, these pages of datawill be called upper page and lower page; however, they can be givenother labels. With reference to state A for the process of FIGS. 8A-C,the upper page stores bit 0 and the lower page stores bit 1. Withreference to state B, the upper page stores bit 1 and the lower pagestores bit 0. With reference to state C, both pages store bit data 0.The programming process of FIGS. 8A-C is a two-stage programmingprocess; however, the process of FIGS. 8A-C can be used to implement athree stage process, a four state process, etc. In the first stage, thelower page is programmed. If the lower page is to remain data 1, thenthe memory cell state remains at state E. If the data is to beprogrammed to 0, then the threshold of voltage of the memory cell israised such that the memory cell is programmed to state B′. FIG. 8Atherefore shows the programming of memory cells from state E to stateB′. State B′ depicted in FIG. 8A is an interim state B; therefore, theverify point is depicted as Vvb′, which is lower than Vvb.

In one embodiment, after a memory cell is programmed from state E tostate B′, its neighbor memory cell (on word line WLn+1) in the NANDstring will then be programmed with respect to its lower page. Afterprogramming the neighbor memory cell, the floating gate to floating gatecoupling effect may raise the apparent threshold voltage of earlierprogrammed memory cell. This will have the effect of widening thethreshold voltage distribution for state B′ to that depicted asthreshold voltage distribution 520 of FIG. 8B. This apparent widening ofthe threshold voltage distribution will be remedied when programming theupper page.

FIG. 8C depicts the process of programming the upper page. If the memorycell is in erased state E and the upper page is to remain at 1, then thememory cell will remain in state E. If the memory cell is in state E andits upper page data is to be programmed to 0, then the threshold voltageof the memory cell will be raised so that the memory cell is in state A.If the memory cell was in intermediate threshold voltage distribution520 and the upper page data is to remain at 1, then the memory cell willbe programmed to final state B. If the memory cell is in intermediatethreshold voltage distribution 520 and the upper page data is to becomedata 0, then the threshold voltage of the memory cell will be raised sothat the memory cell is in state C. The process depicted by FIGS. 8A-Creduces the effect of floating gate to floating gate coupling becauseonly the upper page programming of neighbor memory cells will have aneffect on the apparent threshold voltage of a given memory cell. Anexample of an alternate state coding is to move from distribution 520 tostate C when the upper page data is a 1, and to move to state B when theupper page data is a 0.

Although FIGS. 8A-C provide an example with respect to four data statesand two pages of data, the concepts taught by FIGS. 8A-C can be appliedto other implementations with more or less than four states anddifferent than two pages. More details about the programming process ofFIG. 8A-C can be found in U.S. Pat. No. 7,196,928, incorporated hereinby reference.

FIGS. 9A-C provide another example of a multi-stage programming process.FIG. 9A shows four threshold voltage distributions: E, A, B and C.Threshold voltage distribution E represents erased memory cells.Threshold voltage distributions A, B and C represent programmed memorycells. Initially, all memory cells are erased to threshold voltagedistribution E. In a first programming stage, memory cells that aresupposed to be programmed to threshold voltage distribution C areprogrammed to threshold voltage distribution C. The first programmingstage is illustrated by FIG. 9B. In the second programming stage, thosememory cells that are to be programmed into threshold voltagedistributions A and B are programmed to the appropriate distribution, asrepresented by FIG. 9C.

In some embodiments of the processes of FIGS. 9A-C, after the firststage is performed for a first set of memory cells and prior to thesecond stage being performed for the first set of memory cells, thefirst stage is performed for a second set of memory cells. In oneimplementation, the first set of memory cells are connected to a firstword line and the second set of memory cells are connected to a secondword line.

FIGS. 10A-D describe another multi-state programming process thatprograms memory cells connected to a common word line and can be used ina similar manner to the process of FIGS. 9A-C. The first stage of theprocess of FIGS. 10A-D includes first programming memory cells targetedfor threshold voltage distributions B and C to an intermediate thresholdvoltage distribution B′, as depicted by threshold voltage distribution530 in FIG. 10A. This first stage is then performed on an adjacent wordline, which causes the intermediate threshold voltage distribution towiden due to coupling from neighboring floating gates (see FIG. 10B).The second programming stage includes programming those memory cellsthat are targeted for threshold voltage distribution C from B′ (see FIG.10C). The third stage of the programming process includes programmingmemory cells from distribution E to distribution A and from B′ to B (seeFIG. 10D).

FIGS. 11A and 11B describe another two stage programming process. In thefirst stage, the memory cells are concurrently programmed in fullsequence from the erased state E to the interim states A*, B* and C*(see FIG. 11A). In the second stage, memory cells in interim state A*are programmed to state A while memory cells in interim state B* areprogrammed to state B and memory cells in interim state C* areprogrammed to state C (See FIG. 11B). The verify points Vva, Vvb and Vvcfor states A, B and C are higher than the verify points for interimstates A*, B* and C*. Thus, during the first stage, a first set ofmemory cells are programmed to a lower threshold voltage than the finaltarget threshold voltage. During the second stage, the first set ofmemory cells have their threshold voltages raised to the final targetthreshold voltage. In one embodiment, after the first stage for thefirst set of memory cells, and prior to the second stage for the firstset of memory cells, the first stage is performed on a second set ofmemory cells that may be connected to the same word line as the firstset of memory cells or a different word line than the first set ofmemory cells. In one example, the first stage is a coarse stage and thesecond stage is a fine stage, thus, interim states A*, B* and C* may bewider than final target states A, B and C.

FIGS. 12A-D disclose a three-stage process for programming non-volatilememory. The process of FIG. 12A-D is performed for non-volatile memorycells that store three bits of data per memory cell. Before programming,all of the memory cells are erased to state S0 (FIG. 12A). FIG. 12Bshows the first stage, which includes programming to state S4′ thosememory cells that are to be finally programmed to S4-S7. FIG. 12C showsthe second stage, which includes programming from state S4′ to statesS4-S7. In one embodiment, S4′ is wider in FIG. 2C because of couplingfrom memory cells on a neighboring word line that were partially orfully programmed between the first and second stages. FIG. 12D shows thethird stage, which includes programming from state S0 to states S1, S2and S3. When programming a first set of memory cells according to theprocess of FIGS. 12A-D, between any of the stages for a first set ofmemory cells, other memory cells (connected to the same word line as thefirst set of memory cells or connected to one or more different wordlines) can be fully or partially programmed.

FIGS. 13A-D show a three-stage programming process for programmingmemory cells that store four bits of data per memory cell. Thus, thefinal set of memory cells can be divided into 16 threshold voltagedistributions. During the first stage (FIG. 13A to FIG. 13B) of thethree-stage programming process, memory cells are programmed into one offour intermediate threshold voltage distributions: E2, A2, B2 and C2.From those four intermediate threshold voltage distributions, the memorycells are then programmed into 16 distributions O-F during the secondstage (FIG. 13B to FIG. 13C). In the third stage (FIG. 13C to FIG. 13D),each of the 16 distributions 0-F are tightened. When programming a firstset of memory cells according to the process of FIGS. 13A-D, between anyof the stages for a first set of memory cells, other memory cells(connected to the same word line as the first set of memory cells orconnected to one or more different word lines) can be fully or partiallyprogrammed.

FIG. 14 is a flow chart describing one embodiment of a process foroperating non-volatile memory, such as the system of FIG. 3 (or othersystems). In step 600, a request to program data is received. Therequest can be from a host, another device or the controller. Therequest can be received at the controller, control circuitry, statemachine, or other device. In response to the request, the controller,control circuitry, state machine, or other device will determine whichblock of flash memory cells will be used to store the data in step 602.The data will be programmed into the determined block using any of theprogramming processes described above (or other programming processes)in step 604. The programmed data will be read one or many times in step606. There is a dashed line between steps 604 and 606 because anunpredictable amount of time may pass between the steps, and step 606 isnot performed in response to step 604. Rather, step 606 is performed inresponse to a request to read the data or other event.

FIG. 15 is a flow chart describing a programming process for programmingmemory cells in a block. FIG. 15 is one embodiment of step 604 of FIG.14. In step 632, memory cells are erased (in blocks or other units)prior to programming. Memory cells are erased in one embodiment byraising the p-well to an erase voltage (e.g., 20 volts) for a sufficientperiod of time and grounding the word lines of a selected block whilethe source and bit lines are floating. A strong electric field is, thus,applied to the tunnel oxide layers of selected memory cells and theselected memory cells are erased as electrons of the floating gates areemitted to the substrate side, typically by Fowler-Nordheim tunnelingmechanism. As electrons are transferred from the floating gate to thep-well region, the threshold voltage of the selected memory cells arelowered. Erasing can be performed on the entire memory array, onindividual blocks, or another unit of cells. Other techniques forerasing can also be used. In step 634, soft programming is performed tonarrow the threshold voltage distribution of the erased memory cells.Some memory cells may be in a deeper erased state than necessary as aresult of the erase process. Soft programming can apply programmingpulses to move the threshold voltage of the deeper erased memory cellsto a higher threshold voltage that is still in a valid range for theerased state. In step 636, the memory cells of the block are programmedas described herein. The process of FIG. 15 can be performed at thedirection of the state machine, controller or combination of statemachine and controller, using the various circuits described above. Forexample, the controller may issue commands and data to the state machineto program the data. In response, the state machine may operate thecircuits described above to carry out the programming operations.

FIG. 16 is a flow chart describing one embodiment of a process forprogramming memory cells connected to a common word line. FIG. 16 isperformed during step 636 of FIG. 15. In one embodiment, the process ofFIG. 16 is used to program all memory cells connected to a common wordline. In other embodiments, the process of FIG. 16 is used to program asubset of memory cells connected to a common word line. For blocks ofmemory that include multiple word lines, therefore, step 636 of FIG. 15includes performing the process of FIG. 16 one or more times for eachword line to program the memory cells in a block.

In one example, memory cells are programmed according to an order thatcomprises programming the memory cells connected to WL0, followed byprogramming the memory cells connected to WL1, followed by programmingthe memory cells connected to WL2, etc. Other orders can also be used.

In other embodiments, a first set of memory cells connected to a firstword line can be subjected to a subset of stages of a multi-stageprogramming process, followed by a second set of memory cells connectedto a second word line being subjected to a subset of stages of themulti-stage programming process, followed by the first set of memorycells connected to the first word line can be subjected to one or moreadditional of stages of the multi-stage programming process, and so on.In such an embodiment, the process of FIG. 16 is performed once per setof memory cells for each stage of the multi-stage programming processduring step 636 of FIG. 15.

In step 660 of FIG. 16, the system will read a stored identification ofa magnitude for an initial programming pulse (hereinafter referred to as“Vpgm_vstart”), which can be based on previous programming or a defaultvalue. As discussed above, the programming process includes applying aset of programming pulses which increase the magnitude of each pulse.For example, FIG. 17 shows an example of a program voltage that includesa set of programming pulses having a magnitude for an initialprogramming pulse designated by Vpgm_vstart and a step size,representing the increment between pulses, designated by ΔVpgm. Themagnitude of the first pulse Vpgm_vstart is read in step 660. In oneembodiment, the magnitude will be determined from one or more previousprogramming processes. If this is the first time that programming isbeing performed, a default value for Vpgm_vstart can be read from aregister. The magnitude of the initial programming pulse, Vpgm_vstart,can also be stored in the flash memory array, ROM, or somewhere else.

The process of FIG. 16 uses two different step sizes: ΔVpgm1 and ΔVpgm2.In one embodiment, ΔVpgm1 is larger than ΔVpgm2. In this manner, theprogramming process of FIG. 16 starts out with the larger step sizeΔVpgm1 so that programming is performed faster. When a predeterminednumber of memory cells reached an intermediate result or condition forthe respective performance of the process of FIG. 16, then the processswitches to the smaller step size for the remainder of the process ofFIG. 16 in order to more accurately continue programming the memorycells to the target conditions for the particular performance of theprocess of FIG. 16. For example, FIG. 18 shows a program voltage thatincludes a set of programming pulses that have a magnitude of theinitial programming pulse, Vpgm_vstart, and initially have a step sizeof ΔVpgm1. After the 6^(th) pulse, the step size changes to ΔVpgm2. Inone embodiment, as described below, the pulse at which the step sizechanges is not determined in advance. The value of the programming pulseat which a predetermined number of memory cells reach an intermediatecondition, thereby causing the step size to change, is used to refinethe magnitude of the initial programming pulse, Vpgm_vstart, for futureprogramming. That is current behavior of the memory cells (e.g., whenthe predetermined number of memory cells reached the intermediatecondition) is used to set the magnitude of the initial programming pulseto increase the speed of the programming process without causingover-programming. In one embodiment, ΔVpgm1 is equal to ΔVpgm2.

Looking back at FIG. 16, in step 662, data is loaded for that particularpage or word line. In step 664, the magnitude of the first program pulseis set to the value for Vpgm_vstart read in step 660. Additionally, theprogram step size ΔVpgm is set to ΔVpgm1, and the program counter PC isinitialized as zero. In step 666, the first program pulse is applied. Asdiscussed above, in one embodiment, the memory cells being programmed bythe process of FIG. 16 are connected to a common word line and, thus,receive the same programming pulses at their respective control gates.After the program pulse, the memory cells are then verified against avoltage Vvstart in step 668. The voltage value Vvstart is chosen bydevice characterization so that any cells that pass Vvstart after one(or a different number) programming pulse are considered fast memorycells. The threshold voltage level of Vvstart is one example of theintermediate condition referenced above. If less than N memory cellsbeing programmed have a threshold voltage greater than Vvstart (step670), then in step 671 it is determined whether the program counter isless than 20 (or another suitable value). If the program counter is notless than 20, the there have been too many iterations and theprogramming process has failed. If the program counter is less than 20(or another suitable value) then in step 672 the program voltage isincremented by ΔVpgm1 and the program counter PC is incremented by 1.Note that in some embodiments it maybe preferred to increase the programcounter with a different value than 1 in order to reflect the largerstep size. For example, the loop counter could be increased by a valueof 2 in case the larger step size is two times larger than the smallerstep size. After step 672, the process loops back to step 666 and thenext program pulse is applied. Step 666-672 will be iterated until atleast N memory cells have a threshold voltage greater than Vvstart. Inone embodiment, the value of N can be 15 memory cells. In otherembodiments, N can be less than 15 (e.g., 1 or another number) orgreater than 15. In some implementations, device characterization orother simulation can be used to determine an appropriate value for N.However, the value of N should be a number less than all of the memorycells that are being programmed.

When, in step 670, it is determined that N or more memory cells have athreshold voltage greater than Vvstart, then the process continues asstep 678, at which the magnitude of the programming pulse just appliedis stored in a register, a flash memory location, or elsewhere, to beused as the magnitude or to determine the magnitude of the initialprogramming pulse, Vpgm_vstart, for future programming. In oneembodiment, the magnitude of the programming pulse just applied is usedas the magnitude of the initial programming pulse, Vpgm_vstart, forfuture programming. In another embodiment, an offset (positive offset ornegative offset) is added to the magnitude of the programming pulse justapplied to determine the magnitude of the initial programming pulse,Vpgm_vstart, for future programming. In some embodiment, the magnitudeof the programming pulse just applied is stored in step 678 and theoffset is applied later. In other embodiments, the offset is used on themagnitude of the programming pulse just applied and the result is storedin step 678. In other embodiments, the value used for the initialprogramming pulse, Vpgm_vstart, for future programming is based on amathematical function of the magnitude of the programming pulse justapplied or the sequence number of the program pulse just applied. All ofthese embodiments discussed above use some identification of theprogramming pulse just applied to determine the magnitude of the initialprogramming pulse, Vpgm_vstart, for future programming. Looking at FIG.17, if after the 6^(th) programming pulse it is determined that N memorycells have a threshold voltage greater than Vvstart, then the magnitudeof the 6th programming pulse (V_at_vstart), or some other relatedindication of the pulse, is stored, with ot without an offset, in step678.

In step 680, the program counter PC is reset to 0 and the processcontinues with step 692, at which time all of the memory cells areverified against the various target verify levels for the differentprogram states. If all of the memory cells are verified to have reachedtheir intended target level (step 682), then the process is complete andstatus is set to pass (step 684). In some embodiments, the programmingprocess can complete successfully if less than all memory cells reachtheir intended target. For example, in some embodiments if almost allmemory cells reach their intended target (e.g., with no more than apredetermined number of cells not reaching their target), the process issuccessful. Memory cells that have not reached their target can becorrected during a read operation using error correction or the data canbe programmed elsewhere in the memory array in case too many cells havefailed to reach their target.

If not all of the memory cells verify (which is likely the first timestep 692 is performed), then those memory cells that have reached theirrespective target threshold voltages are locked out from furtherprogramming. In one embodiment, a memory cell is locked out from furtherprogramming by applying a sufficiently large bit line voltage (e.g.,Vdd), as is known in the art.

In one embodiment, Vvstart is set low enough so that when step 670passes because more than N memory cells have reached Vvstart and theprocesses continues from step 670 to step 678, none of the memory cellswill have reached their target levels until at least one more additionalprogram pulse is applied. In this manner, the program step size ΔVpgm ischanged from ΔVpgm1 to ΔVpgm2 before any memory cells are locked outfrom programming.

If not all of the memory cells verify, then it is determined in step 686whether the program counter is less than 20 (or another suitable value).If the program counter is at 20 (or any other suitable value) orgreater, then too many steps have been performed and the process fails(step 694). If the program counter is still less than 20 (or anotherother suitable value), then the program voltage is stepped by ΔVpgm2 andthe program counter is incremented by one in step 688. In step 690,another program pulse is applied and the process continues at step 692with the memory cells being verified. In some embodiments, the programcounter maybe incremented in step 688 with a value different from one totake into account the difference in step sizes. Note that ΔVpgm2 is asmaller step size than ΔVpgm1. Thus, the program voltage Vpgm increasesmuch faster during the iterations of step 666-672, as compared to theslower rising of the program voltage Vpgm during the iterations of step690-688.

In one embodiment, the program counter is not reset at step 680. In suchan embodiment, the test at step 680 may be changed to determine whetherthe program counter is less than a number higher than 20.

In one example, the process of FIG. 16 is used with the full sequenceprogramming scheme of FIG. 6. In this embodiment, Vva can be used asVvstart or a value below Vva can be used as Vvstart.

There are multi-stage program processes operating on a first set ofmemory cells in a manner such that a second set of memory cells canreceive some programming between stages of the multi-stage programprocesses operating on the first set of memory cells. However, in oneembodiment, once the process of FIG. 16 starts for a group of memorycells, no other memory cells receive programming until the process ofFIG. 16 has completed.

During the verify operations of step 692 and read operations of step606, the selected word line is connected to a voltage, a level of whichis specified for each read operation (e.g., see read compare levels Vra,Vrb, and Vrc, of FIG. 6) or verify operation (e.g. see verify levelsVva, Vvb, and Vvc of FIG. 6) in order to determine whether a thresholdvoltage of the concerned memory cell has reached such level. Afterapplying the word line voltage, the conduction current of the memorycell is measured to determine whether the memory cell turned on inresponse to the voltage applied to the word line. If the conductioncurrent is measured to be greater than a certain value, then it isassumed that the memory cell turned on and the voltage applied to theword line is greater than the threshold voltage of the memory cell. Ifthe conduction current is not measured to be greater than the certainvalue, then it is assumed that the memory cell did not turn on and thevoltage applied to the word line is not greater than the thresholdvoltage of the memory cell.

There are many ways to measure the conduction current of a memory cellduring a read or verify operation. In one example, the conductioncurrent of a memory cell is measured by the rate it discharges orcharges a dedicated capacitor in the sense amplifier. In anotherexample, the conduction current of the selected memory cell allows (orfails to allow) the NAND string that includes the memory cell todischarge a corresponding bit line. The voltage on the bit line ismeasured after a period of time to see whether it has been discharged ornot. Note that the technology described herein can be used withdifferent methods known in the art for verifying/reading. Moreinformation about verifying/reading can be found in the following patentdocuments that are incorporated herein by reference in their entirety:(1) United States Patent Application Pub. No. 2004/0057287; (2) UnitedStates Patent Application Pub No. 2004/0109357; (3) U.S. PatentApplication Pub. No. 2005/0169082; and (4) U.S. Patent Application Pub.No. 2006/0221692. The erase, read and verify operations described aboveare performed according to techniques known in the art. Thus, many ofthe details explained can be varied by one skilled in the art. Othererase, read and verify techniques known in the art can also be used.

FIGS. 19-26 are flow charts describing various embodiments forimplementing step 636 of FIG. 15, programming memory cells, using theprocess of FIG. 16.

FIG. 19 describes an embodiment for implementing a multi-stageprogramming process (or multiple programming processes), including anyof the multi-stage programming processes described above. In theembodiment of FIG. 19, Vpgm_vstart is updated during the first stage ofmulti-stage programming process, and future stages of the samemulti-stage programming process use the Vpgm_vstart from the firststage. In step 702, the first stage of the multi-stage programmingprocess is performed, including performing according to the process ofFIG. 16. As described above, performing the process of FIG. 16 willinclude updating the value of Vpgm_vstart at step 678 of FIG. 16. Instep 704, the second stage of the multi-stage programming process isperformed, including performing the process of FIG. 16 with the valueused for the magnitude of the initial programming pulse, Vpgm_vstart,being (or being based on) the value updated and stored in step 702. Whenperforming step 704, the process of FIG. 16 is modified to skip step 678so that if greater than N memory cells have a threshold voltage greaterthan Vvstart, then the process proceeds from step 670 to step 692 (or,in some embodiments, step 680). In this manner, Vpgm_start is notupdated during the performance of step 704.

In step 706, the third stage of the multi-stage programming process isperformed, including performing the process of FIG. 16 with the valueused for the magnitude of the initial programming pulse, Vpgm_vstart,being (or being based on) the value updated and stored in step 702. Whenperforming step 706, the process of FIG. 16 is modified to skip step 678so that if greater than N memory cells have a threshold voltage greaterthan Vvstart, then the process proceeds from step 670 to step 692 (or,in some embodiments, step 680). In this manner, Vpgm_vstart is notupdated during the performance of step 706.

In step 708, the fourth stage of the multi-stage programming process isperformed, including performing the process of FIG. 16 with the valueused for the magnitude of the initial programming pulse, Vpgm_vstart,being (or being based on) the value updated and stored in step 702. Whenperforming step 706, the process of FIG. 16 is modified to skip step 678so that if greater than N memory cells have a threshold voltage greaterthan Vvstart, then the process proceeds from step 670 to step 692 (or,in some embodiments, step 680). In this manner, Vpgm_vstart is notupdated during the performance of step 708. The flow chart of FIG. 19shows four stages in the multi-stage programming process. However, theprocess of FIG. 19 can be extended to more than four stages by addingextra steps like step 708. Alternatively, the process of FIG. 19 can beused with multi-stage programming processes with only three stages byonly performing steps 702, 704 and 706. The process of FIG. 19 can beused with multi-stage programming processes with only two stages by onlyperforming steps 702 and 704. Note that in some embodiments, the valueof ΔVpgm2 can be changed for each stage of the multi-stage programmingprocess. In other embodiments, each stage will use the same ΔVpgm2.Similarly, in some embodiments, the value of ΔVpgm1 can be changed foreach stage of the multi-stage programming process. In other embodiments,each stage will use the same ΔVpgm2.

In another set of embodiments, steps 702 will include performing theprocess of FIG. 16 and storing a new value for Vpgm_vstart. However,steps 704, 706 and 708 will perform the process of FIG. 19A rather thanthe process of FIG. 16. FIG. 19A is similar to FIG. 16, except thatsteps 666, 668, 670, 671, 672, 678 and 680 are not performed. Steps 660and 662 are the same as in FIG. 16. In step 664 a, ΔVpgm is set toΔVpgm2 and then the process continues at step 690 and a program pulse isapplied. Steps 682, 684, 686, 688, 690, 692 and 694 are the same as inFIG. 16. With this embodiment, there is no time used for searching forthe optimum Vpgm_vstart value since it has already been found. Note thatin some embodiments, the value of ΔVpgm2 can be changed for each stageof the multi-stage programming process. In other embodiments, each stagewill use the same ΔVpgm2.

In one example, the process of FIG. 19 is used with the programmingscheme of FIG. 7. In this embodiment, Vra or another value below Vva canbe used as Vvstart. When using the process of FIG. 19 is used with theprogramming scheme of FIG. 8, a value below Vvb′ can be used as Vvstart.When using the process of FIG. 19 with the programming scheme of FIGS.9A-C, Vva, a value below Vva or a value below Vvc can be used as Vvstartwhen programming data to the C state. When using the process of FIG. 19is used with the programming scheme of FIGS. 10A-D, a value below Vvb′can be used as Vvstart when programming data to B′. When using theprocess of FIG. 19 is used with the programming scheme of FIGS. 1A-B, avalue at or below Vva* can be used as Vvstart when programming data toA*, B* or C*. When the process of FIG. 19 is used with the programmingscheme of FIGS. 12A-E, a value below Vvs4′ can be used as Vvstart whenprogramming data to S4′. When the process of FIG. 19 is used with theprogramming scheme of FIGS. 13A-D, a value at or below VvA2 can be usedas Vvstart when programming data to A2, B2 and C2. Additionally, othervalues for Vvstart can also be used. These values of Vvstart can also beused with the other embodiments described below.

FIG. 20 describes another embodiment for implementing a multi-stageprogramming process (or multiple programming processes), including anyof the multi-stage programming processes described above. In theembodiment of FIG. 20, Vpgm_vstart is updated during each stage ofmulti-stage programming process. In step 724, the first stage of themulti-stage programming process is performed, including performing theprocess of FIG. 16. As described above, performing the process of FIG.16 will include updating the value of Vpgm_vstart at step 678 of FIG.16. In step 726, the second stage of the multi-stage programming processis performed, including performing the process of FIG. 16 with the valueused for Vpgm_vstart being (or being based on) the value updated andstored in step 724. Step 726 will include updating the value ofVpgm_vstart at step 678 of FIG. 16. In step 728, the third stage of themulti-stage programming process is performed, including performing theprocess of FIG. 16 with the value used for Vpgm_vstart being (or beingbased on) the value updated and stored in step 726. Step 728 willinclude updating the value of Vpgm_vstart at step 678 of FIG. 16. Instep 730, the fourth stage of the multi-stage programming process isperformed, including performing the process of FIG. 16 with the valueused for Vpgm_vstart being (or being based on) the value updated andstored in step 728. Step 730 will include updating the value ofVpgm_vstart at step 678 of FIG. 16.

The flow chart of FIG. 20 shows four stages in the multi-stageprogramming process. However, the process of FIG. 20 can be extended tomore than four stages by adding extra steps similar to step 730.Alternatively, the process of FIG. 20 can be used with multi-stageprogramming processes having only three stages by only performing steps724, 726 and 728. The process of FIG. 20 can be used with multi-stageprogramming processes having only two stages by only performing steps724 and 726.

FIG. 21 describes another embodiment for implementing multipleprogramming processes. In the embodiment of FIG. 21, Vpgm_vstart isupdated while programming the first page, and the programming of futurepages use the Vpgm_vstart determined while programming the first page.In step 760, the first page of data is programmed using the process ofFIG. 16, including the updating of the value of Vpgm_vstart at step 678of FIG. 16. In step 762, the second page is programmed using the processof FIG. 16 with the value used for Vpgm_vstart being (or being based on)the value updated and stored in step 760. When performing step 762, theprocess of FIG. 16 is modified to skip step 678 so that if greater thanN memory cells have a threshold voltage greater than Vvstart, then theprocess proceeds from step 670 to step 692. In this manner, Vpgm_startis not updated during the performance of step 762. In step 764, thethird page is programmed using the process of FIG. 16 with the valueused for Vpgm_vstart being (or being based on) the value updated andstored in step 760. When performing step 764, the process of FIG. 16 ismodified to skip step 678 so that if greater than N memory cells have athreshold voltage greater than Vvstart, then the process proceeds fromstep 670 to step 692. In this manner, Vpgm_start is not updated duringthe performance of step 764. If more pages of data need to beprogrammed, the process continues with additional steps similar to step764, but operating on the different page of data. If only two pages ofdata are being programmed, then only steps 760 and 762 need beperformed. In another embodiment, steps 762, 764 and steps foradditional pages will program based on the process of FIG. 19A (ratherthan the above-described modified version of FIG. 16), using theVpgm_vstart from step 760.

FIG. 22 describes another embodiment for implementing multipleprogramming processes. In the embodiment of FIG. 19, Vpgm_vstart isupdated during the programming of each page of data. In step 782, thefirst page of data is programmed using the process of FIG. 16, includingthe updating of the value of Vpgm_vstart at step 678 of FIG. 16. In step784, the second page of data is programmed, including performing theprocess of FIG. 16 with the value used for Vpgm_vstart being (or beingbased on) the value updated and stored in step 782. Step 784 willinclude updating the value of Vpgm_vstart at step 678 of FIG. 16. Instep 786, the third page of data is programmed, including performing theprocess of FIG. 16 with the value used for Vpgm_vstart being (or beingbased on) the value updated and stored in step 784. Step 786 willinclude updating the value of Vpgm_vstart at step 678 of FIG. 16. Ifmore pages of data need to be programmed, the process continues withadditional steps similar to step 786, but operating on the differentpage of data. If only two pages of data are being programmed, then onlysteps 782 and 784 need be performed.

FIG. 23 describes an embodiment for implementing multiple programmingprocess. In the embodiment of FIG. 23, Vpgm_vstart is updated whileprogramming memory cells connected to a first word line, and theprogramming of memory cells on other word lines use the Vpgm_vstartdetermined while programming the memory cells connected to the firstword line. In step 800, memory cells connected to the first word lineare programmed using the process of FIG. 16, including the updating ofthe value of Vpgm_vstart at step 678 of FIG. 16. In step 802, memorycells connected to a second word line are programmed using the processof FIG. 19A or the process of FIG. 16, with the value used forVpgm_vstart being (or being based on) the value updated and stored instep 800. When performing step 802 using the process of FIG. 16, theprocess of FIG. 16 is modified to skip step 678 so that if greater thanN memory cells have a threshold voltage greater than Vvstart, then theprocess proceeds from step 670 to step 692. In this manner, Vpgm_startis not updated during the performance of step 802. In step 804, memorycells connected to a third word line are programmed using the process ofFIG. 19A or the process of FIG. 16 with the value used for Vpgm_vstartbeing (or being based on) the value updated and stored in step 800. Whenperforming step 804 using the process of FIG. 16, the process of FIG. 16is modified to skip step 678 so that if greater than N memory cells havea threshold voltage greater than Vvstart, then the process proceeds fromstep 670 to step 692. In this manner, Vpgm_start is not updated duringthe performance of step 804. If more word lines need to be programmed,the process continues with additional steps similar to 804, butoperating on the different word lines. If only two word lines are beingprogrammed, then only steps 800 and 802 need be performed.

It is also possible in some embodiments that the initial programmingpulse magnitude is determined separately for even and odd word lines.This scheme can be beneficial in cases that, due to manufacturingprocess variations, even and odd word lines have different programmingcharacteristics.

FIG. 24 describes an embodiment for implementing multiple programmingprocess. In the embodiment of FIG. 24, Vpgm_vstart is updatedperiodically. Between updates, the previously determined value forVpgm_vstart is used. In step 820, memory cells are programmed using theprocess of FIG. 16, including the updating of the value of Vpgm_vstartat step 678 of FIG. 16. The next time that data needs to be programmed,the system determines whether the elapsed time since the most recentlydetermined value of Vpgm_vstart was stored is greater than apredetermined period in step 822. If not, then the next programmingprocess of step 824 uses the process of FIG. 16 without updatingVpgm_vstart. That is, the process of FIG. 16 is modified to skip step678 so that if greater than N memory cells have a threshold voltagegreater than Vvstart, then the process proceeds from step 670 to step692. Alternatively, step 824 can be implemented by performing theprocess of FIG. 19A. If, in step 822, it is determined that the elapsedtime since the most recently determined value of Vpgm_vstart was storedis greater than a predetermined period, then in step 826, the nextprogramming process is performed using the method of FIG. 16, includingupdating the value of Vpgm_vstart at step 678 of FIG. 16.

FIG. 25 describes an embodiment for implementing multiple programmingprocesses. In this embodiment, the value of Vpgm_vstart is updated whileperforming the process of FIG. 16 during trial programming. Trialprogramming is a programming process in which user data is notprogrammed. Rather, dummy data and/or dummy memory cells are programmedusing the process of FIG. 16 and during that process Vpgm_vstart isupdated. Subsequently, when programming user data, the process of FIG.16 is used, with Vpgm_vstart being (or being based on) the value basedon the trial programming and Vpgm_vstart not being updated whileprogramming the user data. For example, in step 840, the trialprogramming (using the process of FIG. 16) is performed and Vpgm_vstartis updated. In step 842, user data is programmed using the process ofFIG. 16 and the Vpgm_vstart based on the trial programming. Vpgm_vstartis not updated during step 842. That is, the process of FIG. 16 ismodified to skip step 678 so that if greater than N memory cells have athreshold voltage greater than Vvstart, then the process proceeds fromstep 670 to step 692. In step 844, user data is programmed using theprocess of FIG. 16 and the Vpgm_vstart based on the trial programming.Vpgm_vstart is not updated during step 844. That is, the process of FIG.16 is modified to skip step 678 so that if greater than N memory cellshave a threshold voltage greater than Vvstart, then the process proceedsfrom step 670 to step 692. Additional steps of programming user data canalso be performed, without updating Vpgm_vstart. In some embodiment, theprocess of FIG. 25 can stop after step 842. In alternative embodiments,steps 842 and 844 can be implemented by performing the process of FIG.19A (including not updating Vpgm_vstart) rather than the above-describedmodification to the process of FIG. 16.

Note that the methods for performing multiple programming processesdescribed herein can be used to perform multiple stages of one or moremulti-stage programming processes.

FIG. 26 describes another embodiment for implementing a multi-stageprogramming process, including any of the multi-stage programmingprocesses described above. In the embodiment of FIG. 26, Vpgm_vstart isupdated during the second stage of the multi-stage programming process.In step 846, the first stage of the multi-stage programming processes isperformed using the process of FIG. 16 without updating Vpgm_vstart.That is, the process of FIG. 16 is modified to skip step 678 so that ifgreater than N memory cells have a threshold voltage greater thanVvstart, then the process proceeds from step 670 to step 692.Alternatively, the process of FIG. 19A can be used. In step 848, thesecond stage of the multi-stage programming processes is performed usingthe process of FIG. 16, with updating of Vpgm_vstart. In step 850, thethird stage of the multi-stage programming processes is performed usingthe process of FIG. 16, with the value used for Vpgm_vstart being (orbeing based on) the value stored in step 678 performed during step 848.In some embodiments, step 890 can include updating Vpgm_vstart, while inother embodiments Vpgm_vstart will not be updated in step 890.Additional steps like step 890 can be added to the process of FIG. 26.

In general, coarse/fine programming includes a two phased programmingapproach. The first phase is a coarse phase, where the emphasis is onprogramming quickly, with less need for precision. The second phase isthe fine phase, where the emphasis is on programming with precision. Inone embodiment, the coarse phase includes programming to one or morecoarse verify levels and the fine phase includes programming to one ormore fine verify levels, where the fine verify levels correspond to thetarget levels for programming.

FIGS. 11A and 11B (discussed above) provide one example of coarse/fineprogramming that uses two passes. During the first pass (FIG. 11A) thecoarse phase is implemented. During the second pass (FIG. 11B), thesecond phase is implemented. FIGS. 27 and 28 include graphs that depictan embodiment of coarse/fine programming that uses only one pass, duringwhich both the coarse phase and fine phase are performed.

FIGS. 27A, 27B, and 27C depict the behavior of a fast memory cell whichhas a threshold voltage that passes both the course and target verifylevels in the same pulse so that the memory cell does not enter the finemode. FIGS. 28A, 28B, and 28C depict a slower memory cell thatparticipates in both the coarse and fine modes. FIGS. 27A and 28A depictprogramming pulses Vpgm applied to the control gates of the memory cellsbeing programmed. Note that FIGS. 27A and 28A show the programmingpulses adjacent each to each other to make the graph easier to read.However, there are actually time spaces between the pulse to allow forthe verify operations FIGS. 27B and 28B depict bit line voltages Vb1 forthe memory cells being programmed. FIGS. 27C and 28C depict thethreshold voltages for the memory cells being programmed.

With respect to FIGS. 27A, 27B, and 27C a fast memory cell is depicted.In response to a first pulse that starts at time t0, the memory cell'sthreshold voltage is raised above Vver3. In one embodiment, the verifylevel Vver3 corresponds to Vvstart of FIG. 16. In between t1 and t2, thethreshold voltage of the memory cell rises above both Vver2 (coarseverify level) and Vver1 (fine verify level). At t2, the bit line voltagewill be raised to Vinhibit in order to inhibit (e.g., lockout) anyfurther programming. Note that in one embodiment, Vver3 may be 0.2 v to0.3 v lower than the Vver 2 for the lowest programmed state.

With respect to the slower memory cell of FIGS. 28A-C, the thresholdvoltage of the memory cell will not rise above Vver3 until the periodbetween t2 and t3. Thus, programming pulses will increment by ΔVpgm1prior to t3. If the threshold voltage in more than N memory cells in thepage is greater than Vver3 at t3, then the pulse increment value ischanged at t3 to ΔVpgm2, and subsequent pulses increase in magnitude byΔVpgm2. The threshold voltage in the memory cell increases above Vver2between t3 and t4, therefore, the memory cell enters the fineprogramming phase and the bit line is raised to Vs (e.g., ˜0.2-0.5 v, oranother suitable level) at t4. In between t4 and t5, the thresholdvoltage increase is slowed down due to the increase in bit line voltageand due to the decrease in the Vpgm increment value. However, thethreshold voltage does become greater than Vver1 between t4 and t5;therefore, the threshold voltage has reached its target level and thebit line voltage is raised to Vinhibit in order to inhibit furtherprogramming at t5. The coarse/fine programming technique can be used inconjunction with the various programming processes discussed above.

FIG. 29 provides another embodiment for programming. FIG. 29 depicts analternative embodiment of the process of FIG. 16 that includes steps 922and 924 for determining a future value of Vpgm_vstart later in theprocess, and with more precision. Steps 900-912 of FIG. 29 are the sameas steps 660-672 of FIG. 16. Steps 926, 928, 930, 938, 932 and 934 ofFIG. 29 are the same as steps 682, 684, 686, 694, 688 and 690 of FIG.16. If, in step 910 of FIG. 29, it is determined that N or more memorycells have a threshold voltage greater Vvstart, then the process of FIG.29 proceeds from step 910 to step 914 and resets the program counter PCto zero. After step 914, the process proceeds to step 920. Step 920 ofFIG. 29 is the same as step 692 of FIG. 16. After verifying memory cellsin step 920, step 922 includes determining whether at least M memorycells have reached their target threshold voltage level and have beenlocked out from additional programming. In one example, M could be equalto 15 memory cells. In other embodiments, more or less than 15 can beused. If at least M memory cells have not reached their target thresholdvoltage level and have been locked out from additional programming, theprocess continues to step 926. However, if M memory cells have beenlocked out, then the pulse magnitude for the most recently applied pulseis recorded and the process continues to step 926. Note that the systemonly records the magnitude (or other data) at the first time it isdetermined that M memory cells have reached their target thresholdvoltage level and have been locked out from additional programming.

One embodiment of step 924 includes storing the magnitude of theprogramming pulse just applied in a register, a flash memory location,or elsewhere, to be used as the magnitude or to determine the magnitudeof the initial programming pulse, Vpgm_vstart, for future programming.In one embodiment, the magnitude of the programming pulse just appliedis used as the magnitude of the initial programming pulse, Vpgm_vstart,for future programming. In another embodiment, an offset (positiveoffset or negative offset) is added to the magnitude of the programmingpulse just applied to determine the magnitude of the initial programmingpulse, Vpgm_vstart, for future programming. In some embodiments, themagnitude of the programming pulse just applied is stored in step 924and the offset is applied later. In other embodiments, the offset isused on the magnitude of the programming pulse just applied and theresult is stored in step 924. In some embodiments, the magnitude of theprogramming pulse just applied or an identification of the pulse justapplied are used to determine the magnitude of the initial programmingpulse, Vpgm_vstart, for future programming using a mathematical formulaor other means.

One advantage of using the pulse magnitude from step 924 is that ifΔVpgm2 is smaller than ΔVpgm1, then the resolution will be higher forthe pulse magnitude stored at step 924. The process of FIG. 29 can beused with the embodiments discussed above, including the embodimentsdepicted in FIGS. 6-13.

The above descriptions provide examples of a system that willdynamically adapt the magnitude of the initial programming pulse basedon previous programming processes. In some embodiments, the programmingprocesses include multiple stages where the first stage will includesetting the initial programming pulse magnitude for future stages. Byprogramming a subsequent stage with the optimal initial magnitude,programming time can be shorter (less programming loops). In some priorsystems that do not dynamically set the initial programming voltage asdescribed above, the initial programming voltage is typically set muchlower than optimum to have a margin for cycling and for programmingspeed variations within a device.

In some of the embodiments discussed above, the first programming stageused a larger step size (ΔVpgm) between programming pulses during thefirst stage in order to save programming time. However, to detect themost optimal initial programming voltage Vpgm_vstart for future stages,a smaller step size is desired as the subsequent stage is typicallyprogrammed with a smaller size. Using a smaller step size to determineVpgm_vstart provides greater resolution. However, using a smaller stepsize also increase the time needed to perform programming

Embodiments are discussed below that enable a higher resolution forVpgm_vstart without the full time penalty for using a smaller step size.In one embodiment, when the required minimum number of memory cells havepassed the first verify level VVvstart (or another condition) used todetermine Vpgm_vstart for subsequent programming, one or more additional(or alternative) verify operations (to test for one or more alternativeconditions) at different levels than the first verify level are carriedout in order to increase the resolution with which the initialprogramming voltage Vpgm_vstart can be determined. In one example, oneadditional verify step is performed at a second verify level (e.g.,Vvstart-2) that is different than Vvstart by an amount equal to half (oranother fraction) of the current step size. In such a case, the newinitial programming voltage can be determined with the resolution ofΔVpgm/2. In other embodiments, more than one additional verify operationcan be done in order to further increase the resolution with which theinitial programming voltage can be determined. One advantage of thetechnology is that step size during the first stage of programming doesnot have to be reduced in order to get higher resolution. The onlyincrease in programming time is due to one or more additional verifyoperations, which does not increase the programming time toodramatically.

FIG. 30 shows a graphical representation of threshold voltagedistribution movements in response to the first five programming pulsesof the first stage of a programming process up to the point when thesystem detects the programming pulse magnitude to store in step 678 ofFIG. 16. In the example of FIG. 30, five programming pulses have beenapplied until a sufficient number of memory cells (e.g., 15) havereached Vvstart. As can be seen, a number of memory cells, representedby the shaded region, have threshold voltages greater than Vvstart. Thelast programming pulse applied (the fifth programming pulse) has itsmagnitude stored as Vpgm_vstart, or is used to calculate Vpgm_vstart, instep 678.

FIG. 31 shows a graphical representation of threshold voltagedistribution movements in response to the first three programming pulses(pulse1, pulse2, pulse3) of a programming process up to the point wheregreater than N memory cells are detected to have threshold voltagesgreater than Vvstart. In this case, there also happens to be greaterthan N memory cells having threshold voltages greater than Vvstart-2. Inthis case one or more additional/alternative verify operations areperformed. For example, one additional/alternative verify operation canbe performed at Vstart-2 (an alternative result). When thatadditional/alternative verify operation is performed, it is determinedthat more than N memory cells have threshold voltages greater thanVvstart-2. In this example, Vvstart is greater than Vvstart-2 by ΔVpgm/2(although other values are possible). In that case, the programmingpulse magnitude used to determine the initial programming voltageVpgm_vstart for the subsequent stage will be decreased from themagnitude of pulse 3 by ΔVpgm/2 (although other values are possible).That is, the value stored to be the next initial programming pulsemagnitude is equal to or defined by the magnitude of the thirdprogramming pulse minus Δverify, with Δverify defined as the differencebetween the two verify levels Vvstart and Vvstart-2.

FIG. 32 provides another example for a set of memory cells that areslower to program than the example of FIG. 31. In this example, afterthe third programming pulse (pulse3), a sufficient number of memorycells have passed the Vvstart, however, an insufficient number of memorycells have passed Vvstart-2. Therefore, the programming pulse magnitudeuse to determine the initial programming voltage Vpgm_vstart for thesubsequent stage will be the magnitude of the second programming pulse.

In other embodiments, more than one additional/alternative verifyoperation can be used in order to further increase the resolution withwhich the initial programming pulse can be determined. For example, thesystem can test the memory cells to determine whether greater than N (oranother number) memory cells have a threshold voltage greater thanVvstart-2 and Vvstart-3, wherein the difference between the two verifylevels Vvstart and Vvstart-2 is ΔVpgm/3 and the difference between thetwo verify levels Vvstart-2 and Vvstart-3 is also ΔVpgm/3. So, thedifference between the two verify levels Vvstart and Vvstart-3 is(2)*ΔVpgm/3. If X additional/alternative verify operations are used,then the system will verify at Vvstart, Vvstart-2, Vvstart-3, . . .Vvstart-X, wherein Vvstart-X differs from Vvstart by (X)*ΔVpgm/(1+X).

The advantage of this technology is the step size of the programmingpulses during the first stage of programming does not have to bereduced. The same step size as without doing this technology can be usedand, thus, there is no increase in the number of programming loops forthe first stage.

In some embodiments, Vvstart is the verify level of the lowest thresholdvoltage distribution (e.g., distribution A) to be programmed during thefirst stage. In some embodiments, Vvstart-2 is the verify level of thelowest threshold voltage distribution (e.g., distribution A) to beprogrammed during the first stage while Vvstart is lower than the verifylevel of the lowest threshold voltage distribution. In otherembodiments, Vvstart and Vvstart-2 can both be lower than the verifylevel of the first distribution. In some embodiments, Vvstart is thelowest verify level used in coarse/fine programming of the lowestthreshold voltage distribution to be programmed during the first stagewhile Vvstart-2 can be equal to the verify level of the lowest thresholdvoltage distribution to be programmed during the first stage. After theinitial programming magnitude is detected for future programming stages,it is possible to continue programming with the same step size toprogram distributions equal to or greater than Vvstart-2. In some cases,it may be desired to reduce the step size after the detection of theinitial programming pulse to allow for more accurate programming. Thetechnologies described herein can be combined with the processes of U.S.Pat. No. 7,092,290.

The technology described above for using an additional/alternativeverify level to increase resolution can be used with the process of FIG.16. FIG. 33 is a flow chart describing a process to be added to FIG. 16.The steps depicted in the flow chart of FIG. 33 replace step 678 of FIG.16. For example, after step 670 of FIG. 16 determined that N or morememory cells have threshold voltages greater than Vvstart, the processcontinues at step 970 of FIG. 33. In step 970, the system determineswhether P or more memory cells have a threshold voltage greater thanVvstart-2 (where P can be the same or different than N). If P or morememory cells have a threshold voltage greater than Vvstart-2, then instep 972, the magnitude used to determine the next Vpgm_vstart is (themagnitude of the last pulse applied)−(Δverify). Step 972 includesstoring (the magnitude of the last pulse applied)−(Δverify), asdiscussed above with respect to step 678. Alternatively, step 972includes storing (the magnitude of the last pulseapplied)−(Δverify)+(offset). In another alternative, the system canstore another function of (the magnitude of the last pulseapplied)−(Δverify), a function of an identification of the last pulseapplied and Δverify, a function of an identification of the last pulseapplied and Δverify, or some combination or subset of the above. Valuesother than Δverify can also be used. After step 972, the processcontinues at step 692 of FIG. 16.

If, in step 970, it is determined that there are not P memory cells witha threshold voltage greater than Vvstart-2, then in step 974, themagnitude used to determine the next Vpgm_vstart is the magnitude of thelast pulse applied. Step 974 includes storing the magnitude of the lastpulse applied, as discussed above with respect to step 678.Alternatively, step 972 includes storing (the magnitude of the lastpulse applies)+(offset). In another alternative, the system can storeanother function of the magnitude of the last pulse applied, anidentification of the last pulse applied, a function of anidentification of the last pulse applied, or some combination or subsetof the above. After step 974, the process continues at step 692 of FIG.16.

Similarly, step 924 of FIG. 29 can be replaced with the process of FIG.33. That is, if M memory cells have been locked out, the process willcontinue at step 970. After steps 972 or 974, the process continues atstep 926 of FIG. 29.

FIG. 34 is a flow chart describing a process to be added to FIG. 16 whenthe system performs two extra verify operations to test for twoalternative results. Note that the process of FIG. 34 can be adapted totest for more than two alternative results. The steps depicted in theflow chart of FIG. 34 replace step 678 of FIG. 16. For example, afterstep 670 of FIG. 16 determines that N or more memory cells havethreshold voltages greater than Vvstart, the process continues at step980 of FIG. 34. In step 980, the system determines whether P or morememory cells have a threshold voltage greater than Vvstart-2 (where Pcan be the same or different than N). If it is determined that there arenot P memory cells with a threshold voltage greater than Vvstart-2, thenin step 982 the magnitude or pulse used to determine the nextVpgm_vstart is the magnitude of the last pulse applied. Step 982includes storing the magnitude of the last pulse applied, as discussedabove with respect to step 678. Alternatively, step 982 includes storing(the magnitude of the last pulse applies)+(offset). In anotheralternative, the system can store another function of the magnitude ofthe last pulse applied, an identification of the last pulse or anfunction of the identification of the last pulse. After step 982, theprocess continues at step 692 of FIG. 16.

If P or more memory cells have a threshold voltage greater thanVvstart-2, then, in step 984, it is determined whether T or more memorycells have a threshold voltage greater than Vvstart-3. The value of Tcan be the same or different than N. If it is determined that there arenot T memory cells with a threshold voltage greater than Vvstart-3, thenin step 988 the magnitude used to determine the next Vpgm_vstart (themagnitude of the last pulse applied)−(Δverify1). Step 986 includesstoring (the magnitude of the last pulse applied)−(Δverify1), asdiscussed above with respect to step 678. Alternatively, step 988includes storing (the magnitude of the last pulseapplies)−(Δverify1)+(offset). In another alternative, the system canstore another function of the (the magnitude of the last pulseapplied)−(Δverify1), a function of an identification of the last pulseand (Δverify1), a function of an identification of the last pulse and(Δverify1), or some combination or subset of the above. Values otherthan Δverify1 can also be used. After step 988, the process continues atstep 692 of FIG. 16. In this embodiment, Δverify1 is defined as thedifference between Vvstart and Vvstart-2.

If it is determined that there are T or more memory cells with athreshold voltage greater than Vvstart-3, then in step 986 the magnitudeused to determine the next Vpgm_vstart is (the magnitude of the lastpulse applied)−(Δverify2). Step 986 includes storing (the magnitude ofthe last pulse applied)−(Δverify2), as discussed above with respect tostep 678. Alternatively, step 986 includes storing (the magnitude of thelast pulse applies)−(Δverify2)+(offset). In another alternative, thesystem can store another function of the (the magnitude of the lastpulse applied)−(Δverify2), an identification of the last pulse and(Δverify2), a function of and an identification of the last pulse and(Δverify2), or come combination or subset thereof. After step 986, theprocess continues at step 692 of FIG. 16. In this embodiment, Δverify2is defined as the difference between Vvstart and Vvstart-3.

Similarly, step 924 of FIG. 29 can be replaced with the process of FIG.34. That is, if M memory cells have been locked out, the process willcontinue at step 980. After steps 982, 986 or 988, the process continuesat step 926 of FIG. 29.

The processes of FIG. 33 or FIG. 34 can be used with the processes ofFIG. 29 or FIG. 16 to implement any of the programming schemes discussedabove. In one example where the process of FIG. 33 or FIG. 34 can beused with the process of FIG. 29 to implement the programming scheme ofFIGS. 8A-C, a first programming stage can include programming to athreshold voltage Vvb′ and determining a new value for Vpgm_vstart. Thesecond stage can use the process of FIG. 29 to program to the A, B and Cstate, as depicted in FIG. 8C, using the Vpgm_vstart (with an offset)from the first stage.

The foregoing detailed description of the invention has been presentedfor purposes of illustration and description. It is not intended to beexhaustive or to limit the invention to the precise form disclosed. Manymodifications and variations are possible in light of the aboveteaching. The described embodiments were chosen in order to best explainthe principles of the invention and its practical application to therebyenable others skilled in the art to best utilize the invention invarious embodiments and with various modifications as are suited to theparticular use contemplated. It is intended that the scope of theinvention be defined by the claims appended hereto.

1. A method of programming non-volatile storage, comprising: performingone stage of a multi-stage programming process on a plurality ofnon-volatile storage elements, the multi-stage programming processprograms the plurality of non-volatile storage elements to one or morefinal target conditions, the one stage includes programming thenon-volatile storage elements to one or more first interim targetconditions using a first set of program pulses, performing the one stageincludes: identifying a program pulse associated with achieving aparticular result, performing one or more sensing operations for one ormore alternative results for the non-volatile storage elements, storingan indication based on a first alternate result of the one or morealternative results and the identified program pulse if the sensingoperation determines that greater than a predetermined number of thenon-volatile storage elements achieved the first alternative result, andstoring the indication based on the identified program pulse if thesensing operation does not determine that sufficient number ofnon-volatile storage elements achieved the one or more alternativeresults; and performing an additional stage of the multi-stageprogramming process including applying a second set of program pulseshaving an initial pulse with a magnitude set based on the storedindication.
 2. The method of claim 1, wherein: the one stage furtherincludes reducing an increment between pulses of the first set ofprogram pulses in response achieving the particular result.
 3. Themethod of claim 1, wherein: the identifying the program pulse associatedwith achieving the particular result includes performing a sensingoperation to determine whether a predefined number of non-volatilestorage elements have achieved the particular result and identifying theparticular program pulse that caused the predefined number ofnon-volatile storage elements to have achieved the particular result,the particular program pulse is the program pulse associated withachieving the particular result; and the first alternative resultdiffers from the particular result by a fraction of an increment betweenpulses of the first set of program pulses.
 4. The method of claim 3,wherein: the particular result is a first threshold voltage value; thefirst alternative result is a second threshold voltage value thatdiffers from the particular result by the fraction of the incrementbetween pulses of the first set of program pulses; and the methodfurther includes setting the magnitude of the initial pulse of thesecond set of program pulses to a first level if the stored indicationis based on the identified program pulse and setting the magnitude ofthe initial pulse of the second set of program pulses to a second levelif the stored indication is based on the first alternate result and theidentified program pulse, the second level is lower than the firstlevel.
 5. The method of claim 4, wherein: the one stage further includesreducing an increment between pulses of the first set of program pulsesin response achieving the particular result.
 6. The method of claim 1,wherein: the performing one or more sensing operations for one or morealternative results for the non-volatile storage elements includestesting for the first alternative result and testing for a secondalternate result; the method further includes storing the indicationbased on the second alternate result and the identified program pulse ifthe sensing operation determined that enough non-volatile storageelements achieved the second alternative result; the particular resultis a first threshold voltage value; the first alternative result is asecond threshold voltage value that differs from the particular resultby the fraction of an increment between pulses of the first set ofprogram pulses; the second alternative result is a third thresholdvoltage value that differs from the particular result by a multiple ofthe fraction of the increment between pulses of the first set of programpulses; the method further includes setting the magnitude of the initialpulse of the second set of program pulses to a first level if the storedindication is based on the identified program pulse, setting themagnitude of the initial pulse of the second set of program pulses to asecond level if the stored indication is based on the first alternateresult and the identified program pulse, setting the magnitude of theinitial pulse of the second set of program pulses to a third level ifthe stored indication is based on the second alternate result and theidentified program pulse; and the second level is lower than the firstlevel, and the third level is lower than the second level.
 7. The methodof claim 1, wherein: the particular result is sufficient number ofnon-volatile storage elements reaching one or more first interim targetconditions.
 8. The method of claim 1, wherein: the particular result issufficient number of non-volatile storage elements reaching a conditionintermediate to the first interim target conditions.
 9. The method ofclaim 1, wherein: the plurality of non-volatile storage elements areconnected to a common word line.
 10. The method of claim 1, furthercomprising: performing programming on other non-volatile storageelements in another programming process that is not part of themulti-stage programming process after the performing of the one stageand before the performing of the additional stage, the othernon-volatile storage elements are different than the plurality ofnon-volatile storage elements.
 11. A method for programming non-volatilestorage, comprising: performing multiple programming processes for aplurality of non-volatile storage elements, each of the programmingprocesses operate to program at least a subset of the non-volatilestorage elements to a respective set of target conditions using programpulses; and for at least a subset of the programming processes:identifying a program pulse associated with achieving a particularresult for a respective programming process, performing one or moresensing operations at one or more alternative results for thenon-volatile storage elements, using a first alternative result of theone or more alternative results and the identification of the programpulse to adjust programming for a subsequent programming process for thenon-volatile storage elements if the one or more sensing operationsdetermined that greater than a predetermined number of non-volatilestorage elements achieved the first alternative result, and using theidentification of the program pulse to adjust programming for thesubsequent programming process for the non-volatile storage elements ifthe one or more sensing operations determined that less than a requirednumber of non-volatile storage elements achieved any of the alternativeresults.
 12. The method of claim 11, wherein: the using of thealternative result and the identification of the program pulse to adjustprogramming for the subsequent programming process for the non-volatilestorage elements comprises setting a magnitude of an initial programpulse for the subsequent programming process based on the firstalternative result and the identification of the program pulse; and theusing of the identification of the program pulse to adjust programmingfor a subsequent programming process for the non-volatile storageelements comprises setting the magnitude of the initial program pulsefor the subsequent programming process based on the identification ofthe program pulse.
 13. The method of claim 12, wherein: setting themagnitude of the initial program pulse for the subsequent programmingprocess based on the identification of the program pulse includessetting the magnitude of the initial program pulse for the subsequentprogramming process based on a voltage level of the program pulseassociated with achieving the particular result; and setting themagnitude of the initial program pulse for the subsequent programmingprocess based on the alternative result and the identification of theprogram pulse includes setting the magnitude of the initial programpulse for the subsequent programming process based on the voltage levelof the program pulse associated with achieving the particular resultplus a correction factor due to the first alternative result.
 14. Themethod of claim 11, wherein: the particular result includes a sufficientnumber of non-volatile storage elements reaching an intermediatecondition for the respective programming process; and each of the subsetof programming processes further includes reducing increment betweenprogram pulse in response to achieving the particular result.
 15. Themethod of claim 11, wherein: identifying the program pulse associatedwith achieving the particular result comprises performing a sensingoperation to determine whether a predefined number of non-volatilestorage elements have achieved the particular result and identifying theimmediately preceding program pulse; and the first alternative resultdiffers from the particular result by a fraction of a program incrementbetween program pulses.
 16. The method of claim 11, wherein: theparticular result is a first threshold voltage value; the firstalternative result is a second threshold voltage value that differs fromthe particular result by a fraction of the program increment betweenprogram pulses; the using the identification of the program pulse toadjust programming for the subsequent programming process for thenon-volatile storage elements includes setting the magnitude of theinitial pulse of the subsequent programming process to a first level ifthe sensing operation did not determine that greater than apredetermined number of non-volatile storage elements have higherthreshold voltages than the second threshold voltage value; and theusing the alternative result and the identification of the program pulseto adjust programming for a subsequent programming process for thenon-volatile storage elements includes setting the magnitude of theinitial pulse of the subsequent programming process to a second level ifthe sensing operation determined that greater than the predeterminednumber of non-volatile storage elements have higher threshold voltagesthan the second threshold voltage value, the second level is differentthan the first level.
 17. The method of claim 16, wherein: theparticular result is an intermediate result for the respectiveprogramming process; and each of the subset of programming processesfurther includes reducing increment between program pulse in response toachieving the particular result.
 18. The method of claim 11, wherein:the particular result includes a sufficient number of non-volatilestorage elements reaching one or more target conditions for therespective programming process.
 19. The method of claim 11, wherein: theplurality of non-volatile storage elements are connected to a commonword line; and the program pulses are applied to the common word line.20. The method of claim 11, wherein: using a second alternative resultof the one or more alternative results and the identification of theprogram pulse to adjust programming for the subsequent programmingprocess for the non-volatile storage elements if the one or more sensingoperations determined that greater than a predefined number ofnon-volatile storage elements achieved the second alternative result.21. A method of programming non-volatile storage, comprising: performinga first stage of a multi-stage programming process on a plurality ofnon-volatile storage elements, the multi-stage programming processprograms the plurality of non-volatile storage elements to one or morefinal target conditions, the first stage programs at least a subset ofthe non-volatile storage elements to one or more first interim targetconditions, the performing of the first stage includes: applying a firstset of programming pulses to the non-volatile storage elements with afirst increment between programming pulses, determining that at least apredetermined number of the subset of non-volatile storage elements havereached an intermediate condition for the first stage in response to anth programming pulse of the first set of programming pulses, theintermediate condition for the first stage is different than the one ormore first stage target conditions, in response to determining that atleast the predetermined number of the subset of non-volatile storageelements have reached an intermediate condition, performing a sensingoperation at an alternative condition for the subset of non-volatilestorage elements, storing an indication based on the alternativecondition if the sensing operation found greater than a predefinednumber of non-volatile storage elements in the alternative condition,storing an indication based on the intermediate condition if the sensingoperation did not find greater than the predefined number ofnon-volatile storage elements in the alternative condition, changing thefirst set of programming pulses to have a second increment betweenprogramming pulses in response to determining that at least thepredetermined number of the subset of non-volatile storage elements havereached the intermediate condition for the first stage, the secondincrement between programming pulses is smaller than the first incrementbetween programming pulses, and terminating the first stage when asufficient number of the non-volatile storage elements have reached therespective one or more first stage target conditions; and performing anadditional stage of the multi-stage programming process includingapplying a second set of programming pulses to the plurality ofnon-volatile storage elements, the second set of programming pulses havean initial pulse with a magnitude set based on the stored indication.22. A non-volatile storage apparatus, comprising: a plurality ofnon-volatile storage elements; and one or more managing circuits incommunication with the plurality of non-volatile storage elements, theone or more managing circuits perform multiple programming processes forthe plurality of non-volatile storage elements, each of the programmingprocesses operates to program at least a subset of the non-volatilestorage elements to a respective set of target conditions using programpulses, for at least a subset of the programming processes the one ormore managing circuits identify a program pulse associated withachieving a particular result for a respective programming process andperform one or more sensing operations at one or more alternativeresults for the non-volatile storage elements, the one or more managingcircuits use a first alternative result of the one or more alternativeresults and the identification of the program pulse to adjustprogramming for a subsequent programming process for the non-volatilestorage elements if the one or more sensing operations determined thatgreater than a predetermined number of non-volatile storage elementsachieved the first alternative result, the one or more managing circuitsuse the identification of the program pulse to adjust programming forthe subsequent programming process for the non-volatile storage elementsif the one or more sensing operations determined that less than arequired number of non-volatile storage elements achieved any of thealternative results.
 23. The non-volatile storage apparatus of claim 22,wherein: the one or more managing circuits use the first alternativeresult and the identification of the program pulse to adjust programmingfor the subsequent programming process for the non-volatile storageelements by setting a magnitude of an initial program pulse for thesubsequent programming process based on the first alternative result andthe identification of the program pulse; and the one or more managingcircuits use identification of the program pulse to adjust programmingfor the subsequent programming process for the non-volatile storageelements by setting the magnitude of the initial program pulse for thesubsequent programming process based on the identification of theprogram pulse.
 24. The non-volatile storage apparatus of claim 23,wherein: the one or more managing circuits set the magnitude of theinitial program pulse for the subsequent programming process based onthe identification of the program pulse by setting the magnitude of theinitial program pulse for the subsequent programming process based on avoltage level of the program pulse associated with achieving theparticular result; and the one or more managing circuits set themagnitude of the initial program pulse for the subsequent programmingprocess based on the alternative result and the identification of theprogram pulse by setting the magnitude of the initial program pulse forthe subsequent programming process based on a voltage level of theprogram pulse associated with achieving the particular result plus an acorrection factor due to the first alternative result.
 25. Thenon-volatile storage apparatus of claim 22, wherein: the particularresult includes a sufficient number of non-volatile storage elementsreaching an intermediate condition for the respective programmingprocess; and in each of the subset of programming processes the one ormore managing circuits reduce increment between program pulse inresponse to achieving the particular result.
 26. The non-volatilestorage apparatus of claim 22, wherein: the one or more managingcircuits identify the program pulse associated with achieving theparticular result by performing a sensing operation to determine whethera predefined number of non-volatile storage elements have achieved theparticular result and identifying the immediately preceding programpulse; and the first alternative result differs from the particularresult by a fraction of a program increment between program pulses. 27.The non-volatile storage apparatus of claim 22, wherein: the particularresult is a first threshold voltage value; the first alternative resultis a second threshold voltage value that differs from the particularresult by a fraction of the program increment between program pulses;the one or more managing circuits use the identification of the programpulse to adjust programming for the subsequent programming process forthe non-volatile storage elements by setting the magnitude of theinitial pulse of the subsequent programming process to a first level ifthe sensing operation did not determine that greater than apredetermined number of non-volatile storage elements have higherthreshold voltages than the second threshold voltage value; and the oneor more managing circuits use the first alternative result and theidentification of the program pulse to adjust programming for asubsequent programming process for the non-volatile storage elements bysetting the magnitude of the initial pulse of the subsequent programmingprocess to a second level if the sensing operation determined thatgreater than the predetermined number of non-volatile storage elementshave higher threshold voltages than the second threshold voltage value,the second level is different than the first level.
 28. The non-volatilestorage apparatus of claim 27, wherein: the particular result is anintermediate result for the respective programming process; and in eachof the subset of programming processes the one or more managing circuitsreduce increment between program pulse in response to achieving theparticular result.
 29. The non-volatile storage apparatus of claim 22,wherein: the particular result includes a sufficient number ofnon-volatile storage elements reaching one or more target conditions forthe respective programming process.
 30. The non-volatile storageapparatus of claim 22, further comprising: a first word line, theplurality of non-volatile storage elements are connected to the firstword line, the one or more managing circuits apply the program pulses tothe first word line, and the plurality of non-volatile storage elementsare multi-state flash memory devices.
 31. The non-volatile storageapparatus of claim 22, wherein: the one or more managing circuits use asecond alternative result of the one or more alternative results and theidentification of the program pulse to adjust programming for thesubsequent programming process for the non-volatile storage elements ifthe one or more sensing operations determined that greater than apredefined number of non-volatile storage elements achieved the secondalternative result.
 32. A non-volatile storage apparatus, comprising: aplurality of non-volatile storage elements; and one or more managingcircuits in communication with the plurality of non-volatile storageelements, the one or more managing circuits perform one stage of amulti-stage programming process on the plurality of non-volatile storageelements, the multi-stage programming process programs the plurality ofnon-volatile storage elements to one or more final target conditions,the one stage includes the one or more managing circuits programming thenon-volatile storage elements to one or more first interim targetconditions using a first set of programming pulses and identifying aprogram pulse associated with achieving a particular result, the one ormore managing circuits perform one or more sensing operations for one ormore alternative results for the non-volatile storage elements duringthe one stage, the one or more managing circuits store an indicationbased on a first alternate result and the identified program pulse ifthe sensing operation determined that greater than a predeterminednumber of the non-volatile storage elements achieved the firstalternative result, the one or more managing circuits store theindication based on the identified program pulse if the sensingoperation does not determine that sufficient number of non-volatilestorage elements achieved the one or more alternative results, the oneor more managing circuits perform an additional stage of the multi-stageprogramming process including applying a second set of programmingpulses having an initial pulse with a magnitude set based on the storedindication.
 33. The non-volatile storage apparatus of claim 32, wherein:the one or more managing circuits reduce a increment between pulses ofthe first set of program pulses in response achieving the particularresult.
 34. The non-volatile storage apparatus of claim 32, wherein: theparticular result is a first threshold voltage value; the firstalternative result is a second threshold voltage value that differs fromthe particular result by a fraction of the increment between pulses ofthe first set of program pulses; and the one or more managing circuitsset the magnitude of the initial pulse of the second set of programmingpulses to a first level if the stored indication is based on theidentified program pulse and set the magnitude of the initial pulse ofthe second set of programming pulses to a second level if the storedindication is based on the first alternate result and the identifiedprogram pulse, the second level is lower than the first level.
 35. Thenon-volatile storage apparatus of claim 32, further comprising: a firstword line, the plurality of non-volatile storage elements are connectedto the first word line, the one or more managing circuits apply thefirst set of programming pulses and the second set of programming pulsesto the first word line, the plurality of non-volatile storage elementsare multi-state flash memory devices.
 36. The non-volatile storageapparatus of claim 32, wherein: the one or more managing circuitsperform programming on other non-volatile storage elements in anotherprogramming process that is not part of the multi-stage programmingprocess after the performing of the one stage and before the performingof the additional stage, the other non-volatile storage elements aredifferent than the plurality of non-volatile storage elements.